Publications of Lihong Feng

Li, S.; Yue, Y.; Feng, L.; Benner, P.; Seidel-Morgenstern, A.: Model Reduction for Linear Simulated Moving Bed Chromatography Systems Using Krylov-Subspace Methods. AIChE-Journal 60 (11), pp. 3773 - 3783 (2014)

Feng, L.; Benner, P.; Korvink, J. G.: Subspace Recycling Accelerates the Parametric Macro‐modeling of MEMS. International Journal for Numerical Methods in Engineering 94 (1), pp. 84 - 110 (2013)

Bechtold, T.; Schrag, G.; Feng, L. (Eds.): System-level Modeling of MEMS. Wiley-VCH, Weinheim (2013), 530 pp.

Korvink, J.; Poletkin, K.; Deng, Y.; Feng, L.: A digital twin for MEMS and NEMS. In: Springer Handbook of Semiconductor Devices, Part 4, Modeling, pp. 1303 - 1334 (Eds. Rudan, M.; Brunetti, R.; Reggiani, S.). Springer, Cham, Switzerland (2023)

Chellappa, S.; Feng, L.; Benner, P.: An Adaptive Sampling Approach for the Reduced Basis Method. In: Realization and Model Reduction of Dynamical Systems – A Festschrift in Honor of 70th Birthday of Thanos Antoulas, pp. 137 - 155 (Eds. Beattie, C.; Benner, P.; Embree, M.; Gugercin, S.; Lefteriu, S.). Springer International Publishing, Cham (2022)

Benner, P.; Feng, L.: Model Order Reduction based on Moment-Matching. In: Model Order Reduction: Volume 1: System- and Data-Driven Methods and Algorithms, pp. 57 - 96 (Eds. Benner, P.; Grivet-Talocia, S.; Quarteroni, A.; Rozza, G.; Schilders, W. et al.). De Gruyter, Berlin, Boston (2021)

Chellappa, S.; Feng, L.; de la Rubia, V.; Benner, P.: Adaptive Interpolatory MOR by Learning the Error Estimator in the Parameter Domain. In: Model Reduction of Complex Dynamical Systems, pp. 97 - 117 (Eds. Benner, P.; Breiten, T.; Faßbender, H.; Hinze, M.; Stykel, T. et al.). Birkhäuser, Cham (2021)

Banagaaya, N.; Feng, L.; Benner, P.: Sparse (P)MOR for Electro-Thermal Coupled Problems with Many Inputs. In: Nanoelectronic Coupled Problems Solutions, pp. 311 - 328 (Eds. ter Maten, E. J. W.; Brachtendorf, H.-G.; Pulch, R.; Schoenmaker, W.; De Gersem, H.). Springer International Publishing, Cham (2019)

Feng, L.; Benner, P.: Parametric Model Order Reduction for Electro-Thermal Coupled Problems. In: Nanoelectronic Coupled Problems Solutions, pp. 293 - 309 (Eds. ter Maten, E. J. W.; Brachtendorf, H.-G.; Pulch, R.; Schoenmaker, W.; De Gersem, H.). Springer International Publishing, Cham (2019)

Yue, Y.; Feng, L.; Benner, P.; Pulch, R.; Schöps, S.: Reduced Models and Uncertainty Quantification. In: Nanoelectronic Coupled Problems Solutions, pp. 329 - 346 (Eds. ter Maten, E. J. W.; Brachtendorf, H.-G.; Pulch, R.; Schoenmaker, W.; De Gersem, H.). Springer International Publishing, Cham (2019)

Banagaaya, N.; Feng, L.; Schoenmaker, W.; Meuris, P.; Gillon, R.; Benner, P.: Sparse Model Order Reduction for Electro-Thermal Problems with Many Inputs. In: Scientific Computing in Electrical Engineering, pp. 189 - 202 (Eds. Langer, U.; Amrhein, W.; Zulehner, W.). Springer International Publishing, Cham (2018)

Banagaaya, N.; Benner, P.; Feng, L.: Parametric Model Order Reduction for Electro-Thermal Coupled Problems with Many Inputs. In: Progress in Industrial Mathematics at ECMI 2016, pp. 263 - 270 (Eds. Quintela, P.; Barral, P.; Gómez, D.; Pena, F. J.; Rodríguez, J. et al.). Springer International Publishing, Cham (2017)

Feng, L.; Antoulas, A. C.; Benner, P.: Automatic Generation of Reduced Order Models for Linear Parametric Systems. In: Progress in Industrial Mathematics at ECMI 2014, pp. 811 - 818 (Eds. Russo, G.; Capasso, V.; Nicosia, G.; Romano, V.). Springer International Publishing, Cham (2017)

Janssen, H. H. J. M.; Benner, P.; Bittner, K.; Brachtendorf, H.-G.; Feng, L.; ter Maten, E. J. W.; Pulch, R.; Schoenmaker, W.; Schöps, S.; Tischendorf, C.: The European Project nanoCOPS for Nanoelectronic Coupled Problems Solutions. In: Progress in Industrial Mathematics at ECMI 2014, pp. 835 - 842 (Eds. Russo, G.; Capasso, V.; Nicosia, G.; Romano, V.). Springer International Publishing, Cham (2017)

Feng, L.; Meuris, P.; Schoenmaker, W.; Benner, P.: Parametric and Reduced-Order Modeling for the Thermal Analysis of Nanoelectronic Structures. In: Scientific Computing in Electrical Engineering, pp. 155 - 163 (Eds. Bartel, A.; Clemens, M.; Günther, M.; ter Maten, E. J. W.). Springer International Publishing, Cham (2016)

Benner, P.; Breiten, T.; Feng, L.: Matrix Equations and Model Reduction. In: Matrix Functions and Matrix Equations, pp. 50 - 75 (Eds. Bai, Z.; Gao, W.; Su, Y.). World Scientific Publishing, Singapore (2015)

Benner, P.; Feng, L.; Li, S.; Zhang, Y.: Reduced-Order Modeling and ROM-Based Optimization of Batch Chromatography. In: Numerical Mathematics and Advanced Applications - ENUMATH 2013, pp. 427 - 435 (Eds. Abdulle, A.; Deparis, S.; Kressner, D.; Nobile, F.; Picasso, M.). Springer International Publishing, Cham (2015)

Benner, P.; Feng, L.: A Robust Algorithm for Parametric Model Order Reduction Based on Implicit Moment Matching. In: Reduced Order Methods for Modeling and Computational Reduction, pp. 159 - 185 (Eds. Quarteroni, A.; Rozza, G.). Springer International Publishing, Cham (2014)

Feng, L.; Benner, P.; Korvink, J. G.: System-Level Modeling of MEMS by Means of Model Order Reduction (Mathematical Approximation) - Mathematical Background. In: System-level Modeling of MEMS, pp. 53 - 93 (Eds. Bechtold, T.; Schrag, G.; Feng, L.). Wiley-VCH, Weinheim (2013)

Mattucci, E.; Feng, L.; Benner, P.; Romano, D.; Antonini, G.: Fast Frequency-Domain Analysis for Parametric Electromagnetic Models Using Deep Learning. In: 2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS). IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), Milpitas, CA, USA, October 15, 2023 - October 18, 2023. (2023)