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Journal Article (3)

  1. Journal Article
    Banagaaya, N.; Benner, P.; Feng, L.; Meuris, P.; Schoenmaker, W.: An Index-Aware Parametric Model Order Reduction Method for Parameterized Quadratic Differential–Algebraic Equations. Applied Mathematics and Computation 319, pp. 409 - 424 (2017)
  2. Journal Article
    Feng, L.; Yue, Y.; Banagaaya, N.; Meuris, P.; Schoenmaker, W.; Benner, P.: Parametric Modeling and Model Order Reduction for (Electro-)Thermal Analysis of Nanoelectronic Structures. Journal of Mathematics in Industry 6 (1), 10 (2016)
  3. Journal Article
    ter Maten, E. J. W.; Putek, P.; Günther, M.; Pulch, R.; Tischendorf, C.; Strohm, C.; Schoenmaker, W.; Meuris, P.; de Smedt, B.; Benner, P. et al.; Feng, L.; Banagaaya, N.; Yue, Y.; Janssen, R.; Dohmen, J. J.; Tasić, B.; Deleu, F.; Gillon, R.; Wieers, A.; Brachtendorf, H.-G.; Bittner, K.; Kratochvíl, T.; Petřzela, J.; Sotner, R.; Göthans, T.; Dřínovský, J.; Schöps, S.; Duque Guerra, D. J.; Casper, T.; De Gersem, H.; Römer, U.; Reynier, P.; Barroul, P.; Masliah, D.; Rousseau, B.: Nanoelectronic COupled Problems Solutions - nanoCOPS: Modelling, Multirate, Model Order Reduction, Uncertainty Quantification, Fast Fault Simulation. Journal of Mathematics in Industry 7 (1), 2 (2016)

Book (1)

  1. Book
    Banagaaya, N.; Ali, G.; Schilders, W. H. A.: Index-aware Model Order Reduction Methods. Atlantis Press, Paris (2016), 86 pp.

Book Chapter (2)

  1. Book Chapter
    Banagaaya, N.; Feng, L.; Schoenmaker, W.; Meuris, P.; Gillon, R.; Benner, P.: Sparse Model Order Reduction for Electro-Thermal Problems with Many Inputs. In: Scientific Computing in Electrical Engineering, pp. 189 - 202 (Eds. Langer, U.; Amrhein, W.; Zulehner, W.) (2018)
  2. Book Chapter
    Banagaaya, N.; Benner, P.; Feng, L.: Parametric Model Order Reduction for Electro-Thermal Coupled Problems with Many Inputs. In: Progress in Industrial Mathematics at ECMI 2016, pp. 263 - 270 (Eds. Quintela, P.; Barral, P.; Gómez, D.; Pena, F. J.; Rodríguez, J. et al.). Springer International Publishing, Cham, Switzerland (2017)

Conference Paper (1)

  1. Conference Paper
    Banagaaya, N.; Feng, L.; Schoenmaker, W.; Meuris, P.; Wieers, A.; Gillon, R.; Benner, P.: Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs. In: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp. 313 - 318. 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE 2016), Dresden, Germany, March 14, 2016 - March 18, 2016. (2016)

Meeting Abstract (1)

  1. Meeting Abstract
    Banagaaya, N.; Feng, L.; Meuris, P.; Schoenmaker, W.; Benner, P.: Model Order Reduction of an Electro-Thermal Package Model. In IFAC-PapersOnLine, 48 (1), pp. 934 - 935. 8th Vienna International Conference on Mathematical Modelling, Vienna, Austria, February 18, 2015 - February 20, 2015. (2015)
 
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