Publikationen von Baptiste Gault

Peng, Z.; Lu, Y.; Hatzoglou, C.; Kwiatkowski da Silva, A.; Vurpillot, F.; Ponge, D.; Raabe, D.; Gault, B.: An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis 25 (2), S. 389 - 400 (2019)

Katnagallu, S.; Mouton, I.; Oliveira, F.; Gault, B.; Raabe, D.; Stephenson, L. T.: An Atomic Renaissance For Pulsed Field Ion Microscopy. In Microscopy and Microanalysis, 25 S2, S. 304 - 305. M & M 2019 : Microscopy & Microanalysis 2019, Portland, Oregon, USA, 04. August 2019 - 08. August 2019. (2019)